Neutron-Induced Soft Errors for advanced DRAM
Test Site : The Svedberg Laboratory (TSL), Uppsala University, Sweden
Date : December 3-5, 2012
Sample : DRAM
The DRAM devices were exposed to atmospheric-like spectrum of a neutron beam of up to 180 MeV at TSL.
The tests were performed under different test conditions such as data background variations.
The vendor name and more detailed information have been omitted for confidentiality.