작성일 : 12-12-11 19:04
Neutron-Induced Soft Errors for advanced DRAM
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Neutron-Induced Soft Errors for advanced DRAM
 
Test Site  : The Svedberg Laboratory (TSL), Uppsala University, Sweden
 
Date : December 3-5, 2012
 
Sample : DRAM
 
The DRAM devices were exposed to atmospheric-like spectrum of a neutron beam of up to 180 MeV at TSL.
 
The tests were performed under different test conditions such as data background variations.
 
The vendor name and more detailed information have been omitted for confidentiality.
 
 





 
 

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