작성일 : 15-01-11 00:41
Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015
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Authors :
GeunYong Bak, Soonyoung Lee, Hosung Lee, KyungBae Park, Sanghyeon Baeg,
ShiJie Wen, Richard Wong, and Charlie Slayman
Title : Logic Soft Error Study with 800-MHz DDR3 SDRAMs in 3x nm Using Proton and Neutron Beams
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Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015
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Neutron-Induced Soft Errors for advanced DRAM
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4726
4
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