작성일 : 13-02-14 01:13
Accepted for publication in IEEE Trans. on Nuclear Science
 글쓴이 : webmaster
조회 : 4,597  

Title : 
Memory Reliability Analysis for Multiple Block Effect of Soft Errors

Authors : 
Soonyoung Lee, Sanghoon Jeon, Sanghyeon Baeg, and Dongho Lee

Appears in : 
Accepted for publication in IEEE Trans. on Nuclear Science

AbstractMultiple bit upsets (MBU) are analyzed from the perspective of the number of accessed blocks (NAB) in multiple memory block structures. The NAB represents the number of accessed blocks for a single memory operation. Statistical model of the MBU with regards to the NAB is developed, and its correlation to the test results presented. The tests were performed with neutron irradiation facility at The Svedberg Laboratory. The NAB in structure of multiple memory blocks is one of the most important parameter in determining the reliability of the memory. Although multiple cell upsets can be effectively spread out as multiple single bit upsets by interleaving distance scheme, the word failure rates are increased by combination of multiple events from multiple memory blocks. The proposed model can be effectively used for the estimation of the mean time to the failure with different design parameters during the early design states. 


 
 

Total 18
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18 Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015 webmaster 01-11 9742
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16 최우수 논문상 수상 (정승재) webmaster 07-13 5429
15 Accepted for publication in IEEE Trans. on Nucl. Sci. webmaster 01-10 5158
14 Summer Internship @ Cisco Systems, Inc. webmaster 08-19 5099
13 Member update webmaster 12-31 5032
12 Internship Technology Graduation Cross Functional @ Cisco Systems, Inc. webmaster 10-27 5005
11 Update the link of three papers webmaster 10-24 4950
10 Paper Accepted for publication in the Journal of the Korean Physical Society webmaster 07-30 4862
9 Neutron-Induced Soft Errors for advanced DRAM webmaster 12-11 4801
8 Paper accepted to RADECS 2012 webmaster 09-18 4713
7 Accepted for publication in IEEE Trans. on Computers webmaster 04-04 4642
6 Accepted for publication in IEEE Trans. on Nuclear Science webmaster 02-14 4598
5 Paper accepted to IJET (International Journal of Engineering and Technology) webmaster 09-05 4477
4 홈페이지가 리뉴얼 되었습니다 webmaster 07-13 3926
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