작성일 : 13-02-14 01:13
Accepted for publication in IEEE Trans. on Nuclear Science
 글쓴이 : webmaster
조회 : 4,897  

Title : 
Memory Reliability Analysis for Multiple Block Effect of Soft Errors

Authors : 
Soonyoung Lee, Sanghoon Jeon, Sanghyeon Baeg, and Dongho Lee

Appears in : 
Accepted for publication in IEEE Trans. on Nuclear Science

AbstractMultiple bit upsets (MBU) are analyzed from the perspective of the number of accessed blocks (NAB) in multiple memory block structures. The NAB represents the number of accessed blocks for a single memory operation. Statistical model of the MBU with regards to the NAB is developed, and its correlation to the test results presented. The tests were performed with neutron irradiation facility at The Svedberg Laboratory. The NAB in structure of multiple memory blocks is one of the most important parameter in determining the reliability of the memory. Although multiple cell upsets can be effectively spread out as multiple single bit upsets by interleaving distance scheme, the word failure rates are increased by combination of multiple events from multiple memory blocks. The proposed model can be effectively used for the estimation of the mean time to the failure with different design parameters during the early design states. 


 
 

Total 18
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18 Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015 webmaster 01-11 9990
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15 Accepted for publication in IEEE Trans. on Nucl. Sci. webmaster 01-10 5392
14 Summer Internship @ Cisco Systems, Inc. webmaster 08-19 5325
13 Member update webmaster 12-31 5265
12 Internship Technology Graduation Cross Functional @ Cisco Systems, Inc. webmaster 10-27 5235
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9 Paper accepted to RADECS 2012 webmaster 09-18 5080
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7 Accepted for publication in IEEE Trans. on Nuclear Science webmaster 02-14 4898
6 Accepted for publication in IEEE Trans. on Computers webmaster 04-04 4893
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4 홈페이지가 리뉴얼 되었습니다 webmaster 07-13 4072
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