작성일 : 12-12-11 19:04
Neutron-Induced Soft Errors for advanced DRAM
 글쓴이 : webmaster
조회 : 4,630  
Neutron-Induced Soft Errors for advanced DRAM
 
Test Site  : The Svedberg Laboratory (TSL), Uppsala University, Sweden
 
Date : December 3-5, 2012
 
Sample : DRAM
 
The DRAM devices were exposed to atmospheric-like spectrum of a neutron beam of up to 180 MeV at TSL.
 
The tests were performed under different test conditions such as data background variations.
 
The vendor name and more detailed information have been omitted for confidentiality.
 
 





 
 

Total 18
번호 제   목 글쓴이 날짜 조회
18 중견연구자지원사업에 선정되었습니다. webmaster 03-07 691
17 BK21+ 사업에 선정되었습니다. webmaster 01-19 2199
16 알키미스트 아이디어 공모전 최우수상 수상 webmaster 12-16 2963
15 홈페이지가 리뉴얼 되었습니다 webmaster 07-13 3823
14 Paper accepted to IJET (International Journal of Engineering and Technology) webmaster 09-05 4338
13 Accepted for publication in IEEE Trans. on Nuclear Science webmaster 02-14 4455
12 Accepted for publication in IEEE Trans. on Computers webmaster 04-04 4495
11 Paper accepted to RADECS 2012 webmaster 09-18 4527
10 Neutron-Induced Soft Errors for advanced DRAM webmaster 12-11 4631
9 Paper Accepted for publication in the Journal of the Korean Physical Society webmaster 07-30 4717
8 Update the link of three papers webmaster 10-24 4779
7 Internship Technology Graduation Cross Functional @ Cisco Systems, Inc. webmaster 10-27 4835
6 Member update webmaster 12-31 4887
5 Summer Internship @ Cisco Systems, Inc. webmaster 08-19 4947
4 Accepted for publication in IEEE Trans. on Nucl. Sci. webmaster 01-10 4987
 1  2