작성일 : 15-01-11 00:41
Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015
 글쓴이 : webmaster
조회 : 10,662  
Authors : GeunYong Bak, Soonyoung Lee, Hosung Lee, KyungBae Park, Sanghyeon Baeg, ShiJie Wen, Richard Wong, and Charlie Slayman
 
Title : Logic Soft Error Study with 800-MHz DDR3 SDRAMs in 3x nm Using Proton and Neutron Beams

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Total 18
번호 제   목 글쓴이 날짜 조회
18 홈페이지가 리뉴얼 되었습니다 webmaster 07-13 4508
17 최우수 논문상 수상 (정승재) webmaster 07-13 5992
16 Paper Accepted for publication in the Journal of the Korean Physical Society webmaster 07-30 6045
15 Paper accepted to IJET (International Journal of Engineering and Technology) webmaster 09-05 5335
14 Paper accepted to RADECS 2012 webmaster 09-18 5749
13 Update the link of three papers webmaster 10-24 6129
12 Neutron-Induced Soft Errors for advanced DRAM webmaster 12-11 5991
11 Member update webmaster 12-31 5836
10 Accepted for publication in IEEE Trans. on Nuclear Science webmaster 02-14 5657
9 Accepted for publication in IEEE Trans. on Computers webmaster 04-04 5543
8 Summer Internship @ Cisco Systems, Inc. webmaster 08-19 5915
7 BK21+ 사업에 선정되었습니다. webmaster 08-19 7308
6 Internship Technology Graduation Cross Functional @ Cisco Systems, Inc. webmaster 10-27 6054
5 Accepted for publication in IEEE Trans. on Nucl. Sci. webmaster 01-10 6066
4 Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015 webmaster 01-11 10663
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