작성일 : 15-01-11 00:41
Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015
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조회 : 11,255  
Authors : GeunYong Bak, Soonyoung Lee, Hosung Lee, KyungBae Park, Sanghyeon Baeg, ShiJie Wen, Richard Wong, and Charlie Slayman
 
Title : Logic Soft Error Study with 800-MHz DDR3 SDRAMs in 3x nm Using Proton and Neutron Beams

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1 Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015 webmaster 01-11 11256
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