작성일 : 15-01-11 00:41
Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015
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조회 : 10,291
Authors :
GeunYong Bak, Soonyoung Lee, Hosung Lee, KyungBae Park, Sanghyeon Baeg,
ShiJie Wen, Richard Wong, and Charlie Slayman
Title : Logic Soft Error Study with 800-MHz DDR3 SDRAMs in 3x nm Using Proton and Neutron Beams
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3625
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Paper accepted to IEEE International Reliability Physics Symposium (IRPS) 2015
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01-11
10292
14
Accepted for publication in IEEE Trans. on Nucl. Sci.
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5668
13
Internship Technology Graduation Cross Functional @ Cisco Systems, Inc.
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5193
9
Accepted for publication in IEEE Trans. on Nuclear Science
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02-14
5234
8
Member update
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12-31
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7
Neutron-Induced Soft Errors for advanced DRAM
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5434
6
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5569
5
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5386
4
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4997
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