백상현 (Sanghyeon Baeg)
Professor of Electrical and Communication Engineering
E-mail : bau@hanyang.ac.kr
Phone : 031 400 5237
Office : 321, 4th Engineering Building
Education
B.Sc. 1986, Hanyang University, Electronic Engineering
M.S. 1988, The University of Texas at Austin, Electrical and Computer Engineering
Ph.D. 1994, The University of Texas at Austin, Electrical and Computer Engineering
Work Experience
Jan. 2010-Present, Professor, Hanyang University, Ansan, Korea
Jan. 2004-Jan. 2010, Associate Professor, Hanyang University, Ansan, Korea
Jan. 1997-Jan. 2004, Hardware Manager, Technical Leader, Cisco Systems Inc., San Jose, CA, USA
Sep. 1994-Feb. 1997, Sr. Design Engineer, Samsung Semiconductor Inc., Giheung, Korea and San Jose, USA
Professional Activities
Jan. 2012-Dec. 2013, President of the Institute of Semiconductor Test of Korea
Jan. 2010-Dec. 2011, Chief Editor of the Institute of Semiconductor Test of Korea
Apr. 2003, Working Group Member, IEEE Standard 1149.6
: Boundary-Scan Testing of Advanced Digital Networks, IEEE
정성수 (Sung-Soo Chung)
Research Professor
E-mail : sungchung@hanyang.ac.kr
Phone : 031 400 4758
Office : 117, Factory Laboratory Building (공장형실험동 117호)
Education
B.Sc Sungkyunkwan University, Electronic Engineering, Korea
M.S. 1984, Electrical Engineering, Florida Institute of Technology, USA
Work Experience
Aug. 2013-Present, Research Professor, Hanyang University, Ansan, Korea
Apr. 2009-Jul. 2013, Founding President, Eigenix Inc., San Francisco, USA
Jul. 2008-Mar. 2009, VP of R&D, SynTest Technologies Inc., USA
Jan. 2005-May. 2008, Technical Leader, Cisco Systems Inc., USA
Nov. 1992-Dec. 2004, ASIC DFT Senior Manager, Cisco Systems Inc., USA
Jan. 1989-Oct. 1992, Senior Test Development Engineer, Apple Computer Inc., USA
Professional Activities
Working Group Member, JESD89, JEDEC
: Measurement and Reporting of Alpha Praticles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
Working Group Member, IEEE Standard 1149.1
: Test Access Port and Boundary-Scan Architecture, IEEE
Working Group Member, IEEE Standard 1149.6
: Boundary-Scan Testing of Advanced Digital Networks, IEEE
Working Group Member, IEEE Standard P1500
: Embedded Core Test, IEEE
Working Group Member, IEEE Standard P1532
: Boundary-Scan-based In System Configuration of Programmable Devices, IEEE