작성일 : 15-12-25 13:45
교수님 소개
 글쓴이 : webmaster
조회 : 2,675  
백상현 (Sanghyeon Baeg)

Professor of Electrical and Communication Engineering

E-mail : bau@hanyang.ac.kr
Phone : 031 400 5237
Office  : 321, 4th Engineering Building

   Education
     B.Sc.    1986, Hanyang University, Electronic Engineering 
     M.S.     1988, The University of Texas at Austin, Electrical and Computer Engineering
     Ph.D.    1994, The University of Texas at Austin, Electrical and Computer Engineering

   Work Experience
      Jan. 2010-Present,   Professor, Hanyang University, Ansan, Korea
      Jan. 2004-Jan. 2010, Associate Professor, Hanyang University, Ansan, Korea
      Jan. 1997-Jan. 2004, Hardware Manager, Technical Leader, Cisco Systems Inc., San Jose, CA, USA
      Sep. 1994-Feb. 1997, Sr. Design Engineer, Samsung Semiconductor Inc., Giheung, Korea and San Jose, USA

   Professional Activities
      Jan. 2012-Dec. 2013, President of the Institute of Semiconductor Test of Korea
      Jan. 2010-Dec. 2011, Chief Editor of the Institute of Semiconductor Test of Korea
      Apr. 2003, Working Group Member, IEEE Standard 1149.6 
       : Boundary-Scan Testing of Advanced Digital Networks, IEEE



정성수 (Sung-Soo Chung)

Research Professor

E-mail : sungchung@hanyang.ac.kr
Phone : 031 400 4758
Office  : 117, Factory Laboratory Building (공장형실험동 117호)


  Education
    B.Sc    Sungkyunkwan University, Electronic Engineering, Korea
    M.S.    1984, Electrical Engineering, Florida Institute of Technology, USA

  Work Experience
    Aug. 2013-Present, Research Professor, Hanyang University, Ansan, Korea
    Apr. 2009-Jul. 2013, Founding President, Eigenix Inc., San Francisco, USA
    Jul. 2008-Mar. 2009, VP of R&D, SynTest Technologies  Inc., USA
    Jan. 2005-May. 2008, Technical Leader, Cisco Systems Inc., USA
    Nov. 1992-Dec. 2004, ASIC DFT Senior Manager, Cisco Systems Inc., USA
    Jan. 1989-Oct. 1992, Senior Test Development Engineer, Apple Computer Inc., USA

  Professional Activities
     Working Group Member, JESD89, JEDEC
       : Measurement and Reporting of Alpha Praticles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices

     Working Group Member, IEEE Standard 1149.1
       : Test Access Port and Boundary-Scan Architecture, IEEE 
     Working Group Member, IEEE Standard 1149.6
       : Boundary-Scan Testing of Advanced Digital Networks, IEEE 
     Working Group Member, IEEE Standard P1500
       : Embedded Core Test, IEEE

     Working Group Member, IEEE Standard P1532
       : Boundary-Scan-based In System Configuration of Programmable Devices, IEEE