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Professor of Electrical and Communication Engineering
E-mail : bau@hanyang.ac.kr Phone : 031 400 5237 Office : 321, 4th Engineering Building |
Education |
B.Sc. 1986, Hanyang University, Electronic Engineering M.S. 1988, The University of Texas at Austin, Electrical and Computer Engineering Ph.D. 1994, The University of Texas at Austin, Electrical and Computer Engineering |
Work Experience |
Jan. 2010-Present, Professor, Hanyang University, Ansan, Korea Jan. 2004-Jan. 2010, Associate Professor, Hanyang University, Ansan, Korea Jan. 1997-Jan. 2004, Hardware Manager, Technical Leader, Cisco Systems Inc., San Jose, CA, USA Sep. 1994-Feb. 1997, Sr. Design Engineer, Samsung Semiconductor Inc., Giheung, Korea and San Jose, USA
Professional Activities |
Jan. 2012-Dec. 2013, President of the Institute of Semiconductor Test of Korea Jan. 2010-Dec. 2011, Chief Editor of the Institute of Semiconductor Test of Korea Apr. 2003, Working Group Member, IEEE Standard 1149.6 : Boundary-Scan Testing of Advanced Digital Networks, IEEE |
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Research Professor
E-mail : sungchung@hanyang.ac.kr Phone : 031 400 4758 Office : 117, Factory Laboratory Building (공장형실험동 117호)
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Education |
B.Sc Sungkyunkwan University, Electronic Engineering, Korea M.S. 1984, Electrical Engineering, Florida Institute of Technology, USA
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Work Experience |
Aug. 2013-Present, Research Professor, Hanyang University, Ansan, Korea Apr. 2009-Jul. 2013, Founding President, Eigenix Inc., San Francisco, USA Jul. 2008-Mar. 2009, VP of R&D, SynTest Technologies Inc., USA Jan. 2005-May. 2008, Technical Leader, Cisco Systems Inc., USA Nov. 1992-Dec. 2004, ASIC DFT Senior Manager, Cisco Systems Inc., USA Jan. 1989-Oct. 1992, Senior Test Development Engineer, Apple Computer Inc., USA
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Professional Activities |
Working Group Member, JESD89, JEDEC : Measurement and Reporting of Alpha Praticles and Terrestrial Cosmic Ray- Induced Soft Errors in Semiconductor Devices Working Group Member, IEEE Standard 1149.1 : Test Access Port and Boundary-Scan Architecture, IEEE Working Group Member, IEEE Standard 1149.6 : Boundary-Scan Testing of Advanced Digital Networks, IEEE Working Group Member, IEEE Standard P1500 : Embedded Core Test, IEEE Working Group Member, IEEE Standard P1532 : Boundary-Scan-based In System Configuration of Programmable Devices, IEEE
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